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Nikos Boukos was born in Athens (1963) and obtained his BSc in Physics (1985) and PhD diploma (1992) from Aristotelian University of Thessaloniki in Greece. He worked at the Institute of Materials Science of NCSR “D” as a Research Associate (1993-2004) in the field of complex light Al-Li alloys for aeronautical applications and he also studied the microstructure of various materials (metals, semiconductors, magnetic) with electron microscopy. Since 2004 he is a researcher at the Electron Microscopy and Nanomaterials Laboratory initially of the Institute of Materials Science and since 2014 the Institute of Nanoscience and Nanotechnology where he is Director of Research. He has co-authored more than 150 research articles in international peer reviewed journals and 80 conference presentations accumulating more than 2200 scitations (h=24). He has lectured “Physics” at Technological Educational Institute of Athens and Piraeus (1994-2003) and at ASPAITE (2001-2004), “Electric Measurements” at Technological Educational Institute of Chalkis (1996-1997) and at present he co-lectures the undergraduate “Characterization Methods of Materials” at SEMFE and “Electron Microscopy” at two Inter-Departmental Post Graduate Programs of the National Technical University in Athens. His research interests include: • Structural and properties study of nanomaterials using electron microscopy associated techniques such as conventional scanning (SEM) and transmission electron microscopy (TEM), high resolution transmission electron microscopy (HRTEM) and electron energy loss spectroscopy (EELS). • Growth of semiconducting nanostructures with applications in opto- and microelectronics. • Optical properties of semiconductors