Research Interests : MBE growth of semiconductors and dielectric materials and characterization by XPS, ARPES and STM.

Email : e.xenogiannopoulou@inn.demokritos.gr

Research Interests
MBE growth of semiconductors and dielectric materials and characterization by XPS, ARPES and STM.
Position
Research Associates
Telephone
+30 210 650 3338 / 3341
About/Biography
Dr. Evangelia Xenogiannopoulou is Physicist (Univ. of Crete, 2000), received her Master of Science (2002) in ‘Optoelectronics-Microelectronics’ from Univ. of Crete and her Ph.D. in Physics (2006) from Univ. of Patras studying the ultrafast nonlinear optical response of fullerenes, fullerene derivatives, thin films and gold nanoparticles with pump probe techniques.

From 2007 until July 2011, see worked as a Researcher at Applied Research & Development department of CERECO S.A. (Now MIRTEC S.A.) in the field of advanced ceramics and coatings, where she participated in several international and national projects. Since January 2012 she is a Post-Doc Researcher at the Epitaxy and Surface Science Laboratory (ESSL) of INN ‘NCSR Demokritos’ where she participated in the EU Projects (2D-NANOLATTICES and SMARTGATE).

She is currently working on the Project: 2D-TOP – ‘2D crystalline thin films with non-trivial topology’ funded by GSRT-HFRI / 1st call for Post-Doctoral Researchers. 2D-TOP focuses on the experimental realization and physical characterization of two different classes of 2D crystals with a non-trivial topological order, namely the topological insulators (TI) and the topological Weyl semimetals (WSM).

Her expertise includes MBE growth of semiconductors and dielectric materials and characterization by XPS, ARPES and STM.