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Papavieros, G., Constantoudis, V., Vouroutzis, N. and Gogolides, E., Measuring line edge roughness with pixel sizes larger than its value: A mathematical and computational approach Journal of Micro/Nanopatterning, Materials and Metrology, Volume 20, Article Number: 034001, 2021 [doi]

Dimitrakellis, P., Kaprou, G.D., Papavieros, G., Mastellos, D.C., Constantoudis, V., Tserepi, A. and Gogolides, E., Enhanced antibacterial activity of ZnO-PMMA nanocomposites by selective plasma etching in atmospheric pressure Micro and Nano Engineering, Volume 13, Article Number: 100098, 2021 [doi]

Constantoudis, Vassilios, Williams, Bradley, Kehagias, Nikolaos, Papavieros, George, Torres, Clivia M Sotomoyor and Gogolides, Evangelos, Characterization of defects in line/space patterns (Conference Presentation) Metrology, Inspection, and Process Control for Microlithography XXXIV, Volume 11325, Pages: 113250U, 2020 [doi]

Papavieros, G., Kontoyiannis, I., Constantoudis, V. and Gogolides, E., Denoising line edge roughness measurement using hidden Markov models Volume 10959, Article Number: 109592Z, 2019 [doi]

Giannatou, E., Constantoudis, V., Papavieros, G., Papagrorgiou, H., Lorusso, G.F., Rutigliani, V., Van Roey, F. and Gogolides, E., Deep learning nanometrology of line edge roughness Volume 10959, Article Number: 1095920, 2019 [doi]

Constantoudis, Vassilios, Whitworth, Guy, Kehagias, Nikolaos, Papavieros, George, Torres, Clivia M Sotomoyor and Gogolides, Evangelos, Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019, Volume 10958, Pages: 109581K, 2019 [doi]

Constantoudis, V., Papavieros, G. and Gogolides, E., Edge placement error and line edge roughness Volume 10959, Article Number: 109591F, 2019 [doi]

Miquelot, A., Debieu, O., Rouessac, V., Villeneuve, C., Prud'homme, N., Cure, J., Constantoudis, V., Papavieros, G., Roualdes, S. and Vahlas, C., TiO2 nanotree films for the production of green H2 by solar water splitting: From microstructural and optical characteristics to the photocatalytic properties Applied Surface Science, Volume 494, Pages: 1127-1137, 2019 [doi]

Rutigliani, V., Lorusso, G.F., De Simone, D., Lazzarino, F., Rispens, G., Papavieros, G., Gogolides, E., Constantoudis, V. and Mack, C.A., Setting up a proper power spectral density (PSD) and autocorrelation analysis for material and process characterization Volume 10585, Article Number: 105851K, 2018 [doi]

Papavieros, G., Constantoudis, V. and Gogolides, E., Allowable SEM noise for unbiased LER measurement Volume 10585, Article Number: 105851W, 2018 [doi]

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Disclaimer: Publications of INN count all publications involving members of its constituent groups, including those authored when members were working in other Institutions (i.e. without INN affiliation). We apologize for this inconvenience due to method used to find group publications, and declare that the Institute has no claims over publications involving non-INN affiliations.

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