SIEMENS D500 diffractometer

XRD03

CONTACT PERSON:

Dr. Vasilis Psycharis

EMAIL:

v.psycharis@inn.demokritos.gr

CONTACT PERSON:

Dr. C. P. Raptopoulou

EMAIL:

c.raptopoulou@inn.demokritos.gr

XRD /X-Ray Diffraction

Tool
SIEMENS D500 Diffractometer

Applications
Powder samples characterization, Thin film studies

Technical Specifications

Source: Curadiation
-X-ray Generator of 3KW
-Geometry: Bragg-Brentano/parafocusing

Optics: collimators (conventional and capillary optics), primary pyrolytic graphite monochromator
Detectors: scintillation detector (0D)
Sample holder: sample holders for powders, thin films and zero background plates for measuring samples of small quantity. The measurements are performed using the 40-position sample changer.
-Other capabilities: the independent movement of θor 2θangles give the possibility to perform ωscan or rocking curve measurements.

Analysis Software: DCM/EDM (DACO control unit), EVA, JADE 7, PDXL2, Fullprof

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