Scanning Probe Microscope

Tool
SOLVER NANO

Applications
Semicontact Atomic Force Microscopy, Contact Atomic Force Microscopy, Lithography, Magnetic Force Microscopy, Kelvin Probe Microscopy

Technical Specifications
Source: Processing signals received from measuring heads; conversion of signals generated by the computer control program; generating signals for scanners and probe; auxiliary devices control
Sample Size : Diameter up to 25mm, thickness up to 10mm
Sample weight: up to 40 g
Scanner Type: Tubular with displacement sensors
Scan area: 100×100×10 μm

Analysis Software: Nova Px software for data-acquisition and manipulation through the Windows ® environment.

Dr. Thomas Stergiopoulos / t.stergiopoulos@inn.demokritos.gr