TEM02

Tool
FEI CM20 TEM

Applications
Conventional & High ResolutionTransmission Electron Microscopy, Electron Energy Loss Spectroscopy (EELS) and Energy Dispersive X-ray Spectroscopy (EDX) analysis

Source
Thermionic gun LaB6

Beam Voltage 200kV

Detection
•1M pixel CCD camera with GIF
•EDAX EDX system (light elements sensitivity down to B)
•GATAN GIF200 imaging filter

Resolution
TEM point resolution: 0.27nm
TEM information limit: 0.18nm

Positioning
x,y movement: α tilt = ± 45o, β tilt = ± 30o

Other Capabilities Energy Filtered TEM

Dr. Kostas Giannakopoulos (k.giannakopoulos@inn.demokritos.gr)
Dr. A. Travlos (atravlos@inn.demokritos.gr)