JANIS micromanipulator stage

Electrical03

CONTACT PERSON:

Dr. Athanasios Dimoulas

EMAIL:

a.dimoulas@inn.demokritos.gr

Electrical characterization

Tool
JANIS micromanipulator stage

Applications
Electrical characterization of devices

Technical Specifications
The JANIS micromanipulator stage for the electrical validation of devices is equipped with:
-four probes
-continuous flow of LN2 and LHe cryostatand can perform measurements in the range 4K-475K.

The electrical testing setup includes:
-semiconductor device analyzer Keysight B1500,consisting of a waveform generator and fast measurement unit
-AiXACCT ferroelectric thin film tester TX100
-AC current source and nanovoltmeter for Hall measurements
-lock-in amplifier
-HP picoammeter
-LCR bridge

Measurement capabilities:
-electrical and magneto-transport
-transistor transfer characteristics
-high frequency capacitance voltage
-ferroelectric hysteresis and fatigue/retention
-memory and memristor device characterization

Analysis Software:

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