AFM / Atomic Force Microscopy

Tool
Nanoscope IIIAFM

Applications
Surface morphology, (top view, 3D image), roughness and fractality of thin films.

Technical Specifications
Operates in tapping mode (TM) and contact mode (CM)

Manufacturer: Digital Instruments

Dr. Polycarpos Falaras / p.falaras@inn.demokritos.gr