NT-MDT Solver Pro AFM



Dr. Eamonn Devlin



Atomic Force Microscope(AFM)

NT-MDT Solver Pro

Atomic-force microscopy is used to create 3D images ofalmost any type of surface, including polymers, ceramics, composites, glass, metal films, and biological samples. In Magnetic Force Microscopy (MFM) mode, enabled with the use of magnetic tips, it can also carry outmagnetic imaging of surfaces.

Atomic Force Microscopy (AFM) (contact + semicontact + noncontact)/ Lateral Force Microscopy (LFM)/ Phase Imaging mode/ DC&AC Magnetic Force Microscopy (MFM). Scanning range 1.3 to 15 microns along Z direction, 3 to 150 microns along XY.
The integrated optical viewing system has an optical resolution of 3 um and makes it much easier to adjust the laser beam, to choose a surface area for examination and to monitor the scanning process on the screen. The optical system allows exchange of themeasuring heads and samples to obtain optical images of the areas under AFM investigation.The scanning range may vary from 1.3 to 15 microns along Z direction, and from 3 to 150 microns along XY

Additional tools
Halcyonics Mod-1 vibration isolation base

Researcher in charge: Eamonn Devlin

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