SIEMENS D500 diffractometer
XRD03
CONTACT PERSON:
Dr. Vasilis Psycharis
EMAIL:
v.psycharis@inn.demokritos.gr
CONTACT PERSON:
Dr. C. P. Raptopoulou
EMAIL:
c.raptopoulou@inn.demokritos.gr
XRD03
CONTACT PERSON:
Dr. Vasilis Psycharis
EMAIL:
v.psycharis@inn.demokritos.gr
CONTACT PERSON:
Dr. C. P. Raptopoulou
EMAIL:
c.raptopoulou@inn.demokritos.gr
XRD /X-Ray Diffraction
Tool
SIEMENS D500 Diffractometer
Applications
Powder samples characterization, Thin film studies
Technical Specifications
Source: Curadiation
-X-ray Generator of 3KW
-Geometry: Bragg-Brentano/parafocusing
Optics: collimators (conventional and capillary optics), primary pyrolytic graphite monochromator
Detectors: scintillation detector (0D)
Sample holder: sample holders for powders, thin films and zero background plates for measuring samples of small quantity. The measurements are performed using the 40-position sample changer.
-Other capabilities: the independent movement of θor 2θangles give the possibility to perform ωscan or rocking curve measurements.
Analysis Software: DCM/EDM (DACO control unit), EVA, JADE 7, PDXL2, Fullprof