Atomic force microscope

Tool
Veeco Innova (Bruker / previously Veeco)

Applications
Surface topography
Roughness determination
3D imaging of nanomaterials

Technical Specifications
Scanner size : 5x5 μmMaximum permissible imaging height: 1 μm
Operating modes: Contact Mode, TappingMode, Phase Imaging, LiftMode, Magnetic Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Dark Lift,Lateral Force Microscopy, Nano-Indentation, Force Spectroscopy Z Noise Floor <50 pm RMS, typical imaging bandwidth Closed-Loop XY Noise <1.2 nm RMS, typical imaging bandwidthZ Linearizer Noise <200 pm RMS, typical imaging bandwidth

Additional Tools
Temperature controller Veeco diTAC max temperature 50oC