Spectroscopic ellipsometry for film thickness measurement
Plasma Group
CONTACT PERSON:
Evangelos Gogolides
EMAIL:
e.gogolides@inn.demokritos.gr
TELEPHONE:
2106503237
The plasma group offers measurement of thin films thickness using an M2000 spectroscopic ellipsometry instrument by Woolam, or a reflectance probe from ThetaMetrisis. A price list is available upon request.
Details and specifications for our facilities can be found in the plasma group facilities page.