Our custom-built Frequency Domain Thermoreflectance (FDTR) system is a versatile technique to measure the thermal properties of thin films, multilayer stacks, and interfaces that govern the performance and thermal management in semiconductor microelectronics. This optical thermal characterization system combines in-plane and cross-plane thermal conductivity measurements as well as interface thermal conductance measurements. We focus on the study of the anisotropic thermal transport of low-dimensional materials e.g. 2D materials, vdW heterostructures.