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RESEARCH INTERESTS

Mathematical and Computational Nanometrology, Surface modeling and characterization

ABOUT/BIOGRAPHY

George Papavieros holds a PhD in Physics from the Aristotle University of Thessaloniki, an MS in Applied Physics from the New Jersey Institute of Technology (NJIT) and a Bachelor in Physics from the National and Kapodistrian University of Athens. His research experience focused on optical networks, microelectronics, MEMS, material science, device simulation and nanometrology. He has worked as a researcher in the developement and simulation of a MEMS-based infrared sensor at NJIT. His current work and research are on nanometrology ( Plasma Group of the Institute of Nanoscience and Nanotechnology of NCSR Demokritos) and the Research and Development of the metrology software of Nanometrisis. He is also the COO of Nanometrisis P.C and Nanoplasmas P.C

PUBLICATIONS

Papavieros, G, Constantoudis, V, Vouroutzis, N and Gogolides, E, Quantitative characterization of hierarchical multiscale surfaces of micro and nanostructured materials Nanotechnology, IOP Publishing, Volume 34, Pages: 405702, 2023 [doi]

Papavieros, G., Constantoudis, V., Vouroutzis, N. and Gogolides, E., Measuring line edge roughness with pixel sizes larger than its value: A mathematical and computational approach Journal of Micro/Nanopatterning, Materials and Metrology, Volume 20, Article Number: 034001, 2021 [doi]

Dimitrakellis, P., Kaprou, G.D., Papavieros, G., Mastellos, D.C., Constantoudis, V., Tserepi, A. and Gogolides, E., Enhanced antibacterial activity of ZnO-PMMA nanocomposites by selective plasma etching in atmospheric pressure Micro and Nano Engineering, Volume 13, Article Number: 100098, 2021 [doi]

Constantoudis, Vassilios, Williams, Bradley, Kehagias, Nikolaos, Papavieros, George, Torres, Clivia M Sotomoyor and Gogolides, Evangelos, Characterization of defects in line/space patterns (Conference Presentation) Metrology, Inspection, and Process Control for Microlithography XXXIV, Volume 11325, Pages: 113250U, 2020 [doi]

Papavieros, G., Kontoyiannis, I., Constantoudis, V. and Gogolides, E., Denoising line edge roughness measurement using hidden Markov models Volume 10959, Article Number: 109592Z, 2019 [doi]

Giannatou, E., Constantoudis, V., Papavieros, G., Papagrorgiou, H., Lorusso, G.F., Rutigliani, V., Van Roey, F. and Gogolides, E., Deep learning nanometrology of line edge roughness Volume 10959, Article Number: 1095920, 2019 [doi]

Constantoudis, Vassilios, Whitworth, Guy, Kehagias, Nikolaos, Papavieros, George, Torres, Clivia M Sotomoyor and Gogolides, Evangelos, Defects in nano-imprint lithography line patterns: computational modelling and measurement accuracy Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019, Volume 10958, Pages: 109581K, 2019 [doi]

Constantoudis, V., Papavieros, G. and Gogolides, E., Edge placement error and line edge roughness Volume 10959, Article Number: 109591F, 2019 [doi]

Miquelot, A., Debieu, O., Rouessac, V., Villeneuve, C., Prud'homme, N., Cure, J., Constantoudis, V., Papavieros, G., Roualdes, S. and Vahlas, C., TiO2 nanotree films for the production of green H2 by solar water splitting: From microstructural and optical characteristics to the photocatalytic properties Applied Surface Science, Volume 494, Pages: 1127-1137, 2019 [doi]

Rutigliani, V., Lorusso, G.F., De Simone, D., Lazzarino, F., Rispens, G., Papavieros, G., Gogolides, E., Constantoudis, V. and Mack, C.A., Setting up a proper power spectral density (PSD) and autocorrelation analysis for material and process characterization Volume 10585, Article Number: 105851K, 2018 [doi]

Papavieros, G., Constantoudis, V. and Gogolides, E., Allowable SEM noise for unbiased LER measurement Volume 10585, Article Number: 105851W, 2018 [doi]

Constantoudis, V., Papavieros, G., Lorusso, G., Rutigliani, V., Van Roey, F. and Gogolides, E., Multifractal analysis of line-edge roughness Volume 10585, Article Number: 1058534, 2018 [doi]

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