EMI shielding measurements

Nanofunctional and Nanocomposite Materials Laboratory


Christos Trapalis





Measurements of material microwave properties

The measurements of the material microwave properties for the design of effective microwave absorbers and EMI shields are realized with the help of an ANRITSU MS46122B Compact Shockline VNA instrument (1MHz – 43.5 GHz) equipped with coaxial and waveguide accessories. The measurement principle is based on the determination of so-called S-parameters or signals reflected and transmitted by material under test. Powdered materials, free-standing films or coatings on substrates can be used according to the desired application. In the case of powders, they are pressed in specials moulds in the form of toroid or parallelepiped to suit coaxial or waveguide sample holders.

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