Atomic-force microscopy is used to create 3D images of almost any type of surface, including polymers, ceramics, composites, glass, metal films, and biological samples. In Magnetic Force Microscopy (MFM) mode, enabled with the use of magnetic tips, it can also carry out magnetic imaging of surfaces. 

Atomic Force Microscopy (AFM) (contact + semicontact + noncontact)/ Lateral Force Microscopy (LFM)/ Phase Imaging mode/ DC&AC Magnetic Force Microscopy (MFM). Scanning range 1.3 to 15 microns along Z direction, 3 to 150 microns along XY.The scanning range may be varied from 1.3 to 15 microns along the Z direction, and from 3 to 150 microns along XY.

The laboratory uses an NT-MDT Solver Pro scanning probe microscope. The images below show AFM and MFM images the surface of CoPt thin films.