Tool

Thermo Fisher Scientific Talos F200i S/TEM

Applications

Conventional & High Resolution Transmission and Scanning / Transmission Electron Microscopy, Energy Dispersive X-ray Spectroscopy (EDX)

Source

Field Emission Gun

Beam Voltage

200kV

Detection

16 Mpixel CETA CMOS camera
4kx4k STEM imaging
Triple Thermo-Fisher 3 detectors system bright field (BF), annular dark field (DF1,DF2)
Fischione 3000 high angle annular dark field detector (HAADF)
EDX Bruker 6|T Flash 100 mm2 (light elements sensitivity down to Be)

Resolution

TEM point resolution: 0.25nm
TEM information limit: 0.12nm
STEM resolution: 0.16nm

Positioning

x,y movement: α tilt = ± 35^o, β tilt = ± 30^o

Other Capabilities

4 available S/TEM detectors: HAADF, DF4, DF2, BF
max solid angle for EDX: 1.3srad

Additional equipment:

NanoMEGAS

Hardware: DigiSTAR

Software:

TEM Orientation Imaging (ASTAR): This is a technique similar to Electron Backscattered Diffraction (EBSD) in Scanning Electron Microscopy (SEM), but it provides crystallographic orientation and phase maps at a much higher resolution (down to 1-3 nm).

Image 3

Strain Mapping: This allows for the analysis of strain fields in a material with high sensitivity. Electric Field Mapping: A more recent application, this technique uses 4D-STEM to study local electric fields and built-in potentials in functional materials.