Sample preparation for Electron Microscopy
The laboratory hosts a large variety of sample preparation tools (ion mill with a liquid nitrogen-cooled stage, electropolisher, dimpler, disc grinders, metal coater, ultrasonic cutter etc) suitable for SEM and TEM sample preparation of a wide range of materials and structures.

A Model 1020 Plasma Cleaner by Fischione Instruments is used to remove carbonaceous debris from TEM specimens and preventing further contamination during imaging and analysis. Using a low-energy, inductively coupled high-frequency plasma, it cleans surfaces thoroughly without altering their elemental composition or structural integrity.
