Spectroscopic Reflectometer (200-850nm)

Broad-Band reflectance spectroscopy tool for the fast, non-destructive and accurate measurement of thickness and optical properties of films in the 1nanometer-100micrometers thickness range. It operates in the 200-850nm spectral range with optical resolution better than 1.0nm and supports the characterization of almost any transparent and semi-transparent coating either single or in multi-layer stack

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