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RESEARCH INTERESTS

TFTs in polySi and transition metal chalcogenides, thin film sensors, microsystems, new field effect structures

ABOUT/BIOGRAPHY

Dimitrios N. Kouvatsos received his Ph.D. in Electrical Engineering from Lehigh University (USA) in 1991. During 1992 he worked as a Visiting Research Scientist at its Sherman Fairchild Center on TFTs for AMLCD applications; he was also an Adjunct Lecturer at the Department of Electrical Engineering. Since 1994 he is with NCSR “Demokritos”, a Research Director since 2009. He has published 107 papers in research journals and proceedings with over 700 citations, has given 80 conference presentations, is reviewer in 20 journals and has contributed to organizing all ESREF conferences since 2002. He has directed five international projects, two with Sharp Laboratories of America grants on optimization of polySi TFTs in advanced annealed films, and has supervised several Ph.D. dissertations and M.Sc. theses. His research interests include TFTs in polySi and transition metal chalcogenides, integrated microsystems utilizing sensors/detectors and TFT addressing, displays and new field-effect device structures.

PUBLICATIONS

Balliou, Angelika, Papadimitropoulos, Giorgos, Regoutz, Anna, Davazoglou, Dimitris and Kouvatsos, Dimitrios N., Low-Cost, High-Gain MoS2 FETs from Amorphous Low-Mobility Film Precursors ACS Applied Electronic Materials, Volume 4, Pages: 1175-1185, 2022 [doi]

Papadimitropoulos, Giorgos, Balliou, Angelika, Kouvatsos, Dimitris and Davazoglou, Dimitris, Gas Sensing Investigation of Porous Hot-wire Molybdenum Disulphide Thin Films Advanced Materials Letters, International Association of Advanced Materials, Volume 13, Pages: 2201-1689, 2022 [doi]

Papadimitropoulos, Giorgos, Vasilopoulou, Maria, Vourdas, Nikos, N. Kouvatsos, Dimitris, Giannakopoulos, Kostas, Kennou, Stella and Davazoglou, Dimitris, Room temperature growth of ultra porous hot-wire deposited tantalum pentoxide Advanced Materials Letters, International Association of Advanced Materials, Volume 10, Pages: 395-399, 2019 [doi]

Kouvatsos, Dimitrios N, Papadimitropoulos, George, Spiliotis, Thanassis, Vasilopoulou, Maria, Barreca, Davide, Gasparotto, Alberto and Davazoglou, Dimitris, Electrical characteristics of vapor deposited amorphous MoS2 two-terminal structures and back gate thin film transistors with Al, Au, Cu and Ni-Au contacts physica status solidi (c), Wiley Online Library, Volume 12, Pages: 975–979, 2015 [doi]

Papadimitropoulos, G., Vourdas, N., Kontos, A., Vasilopoulou, M., Kouvatsos, D.N., Boukos, N., Gasparotto, A., Barreca, D. and Davazoglou, D., Hot-wire vapor deposition of amorphous MoS2 thin films Physica Status Solidi (C) Current Topics in Solid State Physics, Volume 12, Pages: 969-974, 2015 [doi]

Despina C. Moschou, Christoforos G. Theodorou, Nikolaos A. Hastas, Andreas Tsormpatzoglou, Dimitrios N. Kouvatsos, Apostolos T. Voutsas and Charalabos A. Dimitriadis, Short Channel Effects on LTPS TFT Degradation J. Display Technol., Optica Publishing Group, Volume 9, Pages: 747–754, 2013 [doi]

Moschou, Despina, Vourdas, Nikolaos, Davazoglou, D., Kouvatsos, Dimitrios, Vamvakas, Vassilis and Voutsas, Apostolos, On the optical properties of SLS ELA polycrystalline silicon films Microelectronic Engineering, Volume 90, Pages: 69-71, 2012 [doi]

Despina C. Moschou, Filippos V. Farmakis, Dimitrios N. Kouvatsos and Apostolos T. Voutsas, Vg,max−Vth: A new electrical characterization parameter reflecting the polysilicon film quality of LTPS TFTs Microelectronic Engineering, Volume 90, Pages: 76-78, 2012 [doi]

L. Michalas, M. Koutsoureli, G.J. Papaioannou, D.N. Kouvatsos and A.T. Voutsas, Hydrogen passivation on Sequential Lateral Solidified poly-Si TFTs Microelectronic Engineering, Volume 90, Pages: 72-75, 2012 [doi]

Kontogiannopoulos, Giannis P., Farmakis, Filippos V., Kouvatsos, Dimitrios N., Papaioannou, George J. and Voutsas, Apostolos T., A Practical Model Assessing the Degradation of Polycrystalline Silicon TFTs Due to DC Electrical Stress IEEE Transactions on Electron Devices, Volume 57, Pages: 1390-1398, 2010 [doi]

Kontogiannopoulos, G P, Farmakis, F V, Kouvatsos, D N, Papaioannou, G J and Voutsas, A T, Degradation and lifetime estimation of n-MOS SLS ELA polycrystalline TFTs during hot carrier stressing: effect of channel width in the region Vth ⩽ VGS,stress ⩽ VDS,stress/2 Semiconductor Science and Technology, Volume 24, Pages: 075027, 2009 [doi]

L. Michalas, G.J. Papaioannou, D.N. Kouvatsos and A.T. Voutsas, Back gate influence on front channel operation of p-channel double gate polysilicon TFTs Thin Solid Films, Volume 517, Pages: 6364-6366, 2009 [doi]

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