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TEM characterization of materials and nanostructures

We develop and apply a variety of transmission electron microscopy techniques in order to study materials and nanostructures including conventional and high resolution transmission & scanning/transmission electron microscopy (HR-TEM, HR-S/TEM), energy dispersive X ray spectroscopy (EDS), electron energy loss spectroscopy (EELS) and energy filtered transmission electron microscopy (EFTEM). These methods are used to study the morphology, crystal structure and defects, chemical composition, valency and chemical bonding of a wide range of materials, nanostructures, thin films and interfaces such as oxides, alloys, ceramics, semiconducting, magnetic, composite and 2-D materials for various applications in energy, environment, health care, construction and information & communication technology. In order to fulfill the requirements emerging from the study of so diverse types of materials, specific protocols and methods are developed and applied. The experimental analysis is augmented by visualization-quantification-simulation procedures utilizing dedicated and in-house developed software.

HR-S/TEM image of crystalline defects in Au nanoparticle

HAADF S/TEM image, Si, Ag & Cr elemental maps and corresponding EDX spectrum exhibiting Cr nano-agglomeration on Ag nanoparticles embedded on SiO2 particles

HR-TEM of HfO2 single crystalline nanoparticle

HAADF S/TEM image and EDS elemental maps of composite nanostructured TiO2/Cu2O catalysts

Bright field TEM image, elemental maps, HR-TEM image and the corresponding EDX spectrum of TiO2 photonic crystals with CoOx nanoclusters

HR-S/TEM image of Au nanoparticle

HR-TEM and EELS spectrum of MoS2 nanosheets grown on carbon nanofibers for hydrodesulpurization of oil

Anatase nanoplates with dominant highly reactive {001} facets for environmental applications

TEM micrograph and corresponding EFTEM elemental map of reduced graphene oxide-clay nanocomposite

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