Zinc oxide nanostructures

ZnO is a wide band gap (3.3 eV) semiconductor, which has been the subject of intense interest in recent years. The attractive features of ZnO for optoelectronic applications, in addition to its wide band gap are its high exciton binding energy (60 meV) and the high electron mobility. These -among others- properties are the reason that ZnO is envisaged for a variety of applications concerning solar cells, photocatalytic cells, sensors, memristors and optoelectronics to mention but a few.

We fabricate a variety of ZnO nanostructures, such as nanorods, nanowires, nanoparticles, thin films, employing chemical and electrochemical methods we developed on a wide range of substrates. We tailor the morphology and dimensions of the ZnO nanostructures by varying the growth conditions.

TEM images of ZnO nanorods and nanoparticles

Plane-view and cross section SEM images of the ZnO nanorods

Cross-section SEM image of metal-semiconductor-metal device

We use Scanning Electron Microscopy and Transmission Electron Microscopy techniques in order to study the morphology and crystal structure of the ZnO-based nanostructures and relate the growth conditions with their shape, size, crystal structure and defects as well as chemical composition.

Plane-view SEM image of ZnO/Cu2O heterostrustrures

TEM image of ZnO nanorod

HRTEM of hexagonal singe-crystalline ZnO nanoparticle

The intrinsic point defects, such as zinc and oxygen vacancies, interstitials and antisites, which play a profound role in the electrical behavior of ZnO, have extensively been studied in ZnO nanostructures specifically grown with large concentrations of such defects with photoluminescence spectroscopy.

PL spectrum of ZnO nanoparticles

PL spectra, obtained at T=4.2 K, of ZnO nanorods with various concentrations of intrinsic defects.

We use the functionalized ZnO nanostructures for a variety of applications such as heterostructure p-n junctions and memristors.

Heterojunction diodes MSM (Metal-Semiconductor-Metal)

I-V characteristic curves of metal-semiconductor-metal devices

Electrical pulse test of the metal-semiconductor-metal devices

Pulse retention characterization of metal-semiconductor-metal device

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