Electroluminescence Efficiency Test System

LQ-50X-EL High Speed/High Sensitivity Electroluminescence Efficiency Test System

An advanced instrument designed for precise characterization of electroluminescent devices, such as OLEDs, perovskite LEDs, and infrared emitters. It excels in measuring electroluminescence (EL) efficiency, spectral properties, and device stability, especially under low-light conditions and across a broad spectral range (400-1100 nm).

Skip to content