Atomic force microscope

Tool

Veeco Innova (Bruker / previously Veeco)

Applications

Surface topography 

Roughness determination

3D imaging of nanomaterials

Technical Specifications

Scanner size : 5x5 μm

Maximum permissible imaging height: 1 μm 

Operating modes: Contact Mode, TappingMode, PhaseImaging, LiftMode, Magnetic

Force Microscopy (MFM), Electrostatic Force Microscopy (EFM), Dark Lift,

Lateral Force Microscopy, Nano-Indentation, Force Spectroscopy

Z Noise Floor <50 pm RMS, typical imaging bandwidth

Closed-Loop XY Noise <1.2 nm RMS, typical imaging bandwidth

Z Linearizer Noise <200 pm RMS, typical imaging bandwidth

Additional ToolsTemperature controller Veeco diTAC max temperature 50^oC